Relevance assessment: are judges exchangeable and does it matter

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Authors: Peter Bailey Microsoft, Redmond, WA, USA
Nick Craswell Microsoft, Cambridge, United Kngdm
Ian Soboroff NIST, Gaithersburg, MD, USA
Paul Thomas CSIRO, Canberra, Australia
Arjen P. de Vries CWI, Amsterdam, Netherlands
Emine Yilmaz Microsoft Research, Cambridge, United Kngdm
Relevance assessment: are judges exchangeable and does it matter Published by ACM 2008 Article
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· Proceeding
SIGIR '08 Proceedings of the 31st annual international ACM SIGIR conference on Research and development in information retrieval
Pages 667-674
ACM New York, NY, USA ©2008
table of contents ISBN: 978-1-60558-164-4 doi>10.1145/1390334.1390447

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