A flexible dual frequency testbed for RFID

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Authors: Christoph Angerer Vienna University of Technology, Wien, Austria
Martin Holzer Vienna University of Technology, Wien, Austria
Bastian Knerr Vienna University of Technology, Wien, Austria
Markus Rupp Vienna University of Technology, Wien, Austria
A flexible dual frequency testbed for RFID 2008 Article
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TridentCom '08 Proceedings of the 4th International Conference on Testbeds and research infrastructures for the development of networks & communities
Article No. 3
ICST (Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering) ICST, Brussels, Belgium, Belgium ©2008
table of contents ISBN: 978-963-9799-24-0

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