Timing yield driven clock skew scheduling considering non-Gaussian distributions of critical path delays

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Authors:	Yi Wang	Fudan University, Shanghai, P.R. China
	Wai-Shing Luk	Fudan University, Shanghai, P.R. China
	Xuan Zeng	Fudan University, Shanghai, P.R. China
	Jun Tao	Fudan University, Shanghai, P.R. China
	Changhao Yan	Fudan University, Shanghai, P.R. China
	Jiarong Tong	Fudan University, Shanghai, P.R. China
	Wei Cai	University of North Carolina at Charlotte
	Jia Ni	Fudan University, Shanghai, P.R. China

	2008 Article
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· Proceeding

DAC '08 Proceedings of the 45th annual Design Automation Conference

Pages 223-226
ACM New York, NY, USA ©2008
table of contents ISBN: 978-1-60558-115-6 doi>10.1145/1391469.1391525

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Tags: algorithms clock skew scheduling design non-gaussian process variations reliability reliability, testing, and fault-tolerance vlsi yield

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