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A fast, analytical estimator for the SEU-induced pulse width in combinational designs
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Authors:
Rajesh Garg
Texas A&M University, College Station, TX
Charu Nagpal
Texas A&M University, College Station, TX
Sunil P. Khatri
Texas A&M University, College Station, TX
Published in:
· Proceeding
DAC '08
Proceedings of the 45th annual Design Automation Conference
Pages 918-923
ACM
New York, NY
, USA
©2008
table of contents
ISBN: 978-1-60558-115-6
doi>
10.1145/1391469.1391702
2008 Article
Bibliometrics
· Downloads (6 Weeks): 2
· Downloads (12 Months): 11
· Downloads (cumulative): 125
· Citation Count: 4
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analysis
design
model
performance analysis and design aids
reliability
single event upset
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