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On the rules of low-power design (and how to break them)
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Author:
Todd M. Austin
University of Michigan, Ann Arbor, MI, USA
Published in:
· Proceeding
ISLPED '08
Proceedings of the 13th international symposium on Low power electronics and design
ACM
New York, NY
, USA
©2008
table of contents
ISBN: 978-1-60558-109-5
doi>
10.1145/1393921.1393926
2008 Article
Keynote
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· Downloads (6 Weeks): 3
· Downloads (12 Months): 11
· Citation Count: 0
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design
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performance
performance
reliability
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reliability, testing, and fault-tolerance
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