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Defect prevention with orthogonal defect classification
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Author:
Ajit Ashok Shenvi
Philips Electronics India Limited, Bangalore, India
Published in:
· Proceeding
ISEC '09
Proceedings of the 2nd India software engineering conference
ACM
New York, NY
, USA
©2009
table of contents
ISBN: 978-1-60558-426-3
doi>
10.1145/1506216.1506232
2009 Article
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· Downloads (6 Weeks): 5
· Downloads (12 Months): 79
· Citation Count: 0
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algorithm
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car
checking
design
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life cycle
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