Enabling the adoption of aspects - testing aspects: a risk model, fault model and patterns

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Authors: Nikhil Kumar Applied Technology Solutions, Inc. (ApTSi), Bloomfield Twp., MI, USA
Dinakar Sosale Applied Technology Solutions, Inc. (ApTSi), Bloomfield Twp., MI, USA
Sadhana Nivedita Konuganti Applied Technology Solutions, Inc. (ApTSi), Bloomfield Twp., MI, USA
Ajay Rathi Applied Technology Solutions, Inc. (ApTSi), Bloomfield Twp., MI, USA
Enabling the adoption of aspects - testing aspects: a risk model, fault model and patterns Published by ACM 2009 Article
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· Proceeding
AOSD '09 Proceedings of the 8th ACM international conference on Aspect-oriented software development
Pages 197-206
ACM New York, NY, USA ©2009
table of contents ISBN: 978-1-60558-442-3 doi>10.1145/1509239.1509266

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