Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification

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Authors:	Kohei Miyase	Kyushu Institute of Technology, Iizuka, Japan
	Kenji Noda	STARC Yokohama, Japan
	Hideaki Ito	STARC Yokohama, Japan
	Kazumi Hatayama	STARC Yokohama, Japan
	Takashi Aikyo	STARC Yokohama, Japan
	Yuta Yamato	Kyushu Institute of Technology, Iizuka, Japan
	Hiroshi Furukawa	Kyushu Institute of Technology, Iizuka, Japan
	Xiaoqing Wen	Kyushu Institute of Technology, Iizuka, Japan
	Seiji Kajihara	Kyushu Institute of Technology, Iizuka, Japan

	2008 Article
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	· Proceeding
	ICCAD '08 Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
	Pages 52-58 IEEE Press Piscataway, NJ, USA ©2008 table of contents ISBN: 978-1-4244-2820-5

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