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A new method to improve accuracy of leakage current estimation for transistors with non-rectangular gates due to sub-wavelength lithography effects

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Authors: Kuen-Yu Tsai National Taiwan University, Taipei, Taiwan, R. O. C.
Meng-Fu You National Taiwan University, Taipei, Taiwan, R. O. C.
Yi-Chang Lu National Taiwan University, Taipei, Taiwan, R. O. C.
Philip C. W. Ng National Taiwan University, Taipei, Taiwan, R. O. C.
A new method to improve accuracy of leakage current estimation for transistors with non-rectangular gates due to sub-wavelength lithography effects 2008 Article
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· Proceeding
ICCAD '08 Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
IEEE Press Piscataway, NJ, USA ©2008
table of contents ISBN: 978-1-4244-2820-5

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