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The effect of design parameters on single-event upset sensitivity of MOS current mode logic

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Authors: Mahta Haghi University of Southern California, Los Angeles, CA, USA
Jeff Draper University of Southern California, Marina Del Rey, CA, USA
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· Proceeding
GLSVLSI '09 Proceedings of the 19th ACM Great Lakes symposium on VLSI
ACM New York, NY, USA ©2009
table of contents ISBN: 978-1-60558-522-2 doi>10.1145/1531542.1531599
The effect of design parameters on single-event upset sensitivity of MOS current mode logic Published by ACM 2009 Article
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