Leveraging discarded samples for tighter estimation of multiple-set aggregates

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Authors: Edith Cohen AT&T Labs-Research, Florham Park, NJ, USA
Haim Kaplan Tel Aviv University, Tel Aviv, Israel
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· Proceeding
SIGMETRICS '09 Proceedings of the eleventh international joint conference on Measurement and modeling of computer systems
Pages 251-262
ACM New York, NY, USA ©2009
table of contents ISBN: 978-1-60558-511-6 doi>10.1145/1555349.1555379
Leveraging discarded samples for tighter estimation of multiple-set aggregates Published by ACM 2009 Article
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