A highly configurable test system for evolutionary black-box testing of embedded systems

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Authors: Peter M. Kruse Berner & Mattner Systemtechnik GmbH, Berlin, Germany
Joachim Wegener Berner & Mattner Systemtechnik GmbH, Berlin, Germany
Stefan Wappler Berner & Mattner Systemtechnik GmbH, Berlin, Germany
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· Proceeding
GECCO '09 Proceedings of the 11th Annual conference on Genetic and evolutionary computation
Pages 1545-1552
ACM New York, NY, USA ©2009
table of contents ISBN: 978-1-60558-325-9 doi>10.1145/1569901.1570108
A highly configurable test system for evolutionary black-box testing of embedded systems Published by ACM 2009 Article
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