Reliability aware yield improvement technique for nanotechnology based circuits

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Authors: C. Argyrides University of Bristol, Bristol, UK
G. Dimosthenous University of Bristol, Bristol, UK
D. K. Pradhan University of Bristol, Bristol, UK
C. A. Lisboa Instituto de Informática, PPGC, UFRGS, Porto Alegre -- RS - Brazil
L. Carro Instituto de Informática, PPGC, UFRGS, Porto Alegre -- RS - Brazil
Reliability aware yield improvement technique for nanotechnology based circuits Published by ACM 2009 Article
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SBCCI '09 Proceedings of the 22nd Annual Symposium on Integrated Circuits and System Design: Chip on the Dunes
Article No. 48
ACM New York, NY, USA ©2009
table of contents ISBN: 978-1-60558-705-9 doi>10.1145/1601896.1601958

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