Twin logic gates: improved logic reliability by redundancy concerning gate oxide breakdown

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Authors:	Hagen Saemrow	University of Rostock, Rostock, Germany
	Claas Cornelius	University of Rostock, Rostock, Germany
	Frank Sill	Federal University of Minas Gerais, Belo Horizonte, Brazil
	Andreas Tockhorn	University of Rostock, Rostock, Germany
	Dirk Timmermann	University of Rostock, Rostock, Germany

	2009 Article
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	· Proceeding
	SBCCI '09 Proceedings of the 22nd Annual Symposium on Integrated Circuits and System Design: Chip on the Dunes
	ACM New York, NY, USA ©2009 table of contents ISBN: 978-1-60558-705-9 doi>10.1145/1601896.1601960

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