Architectural assessment of design techniques to improve speed and robustness in embedded microprocessors

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Authors: Thomas Baumann Infineon Technologies, Munich, Germany and Technical University of Munich, Munich, Germany
Doris Schmitt-Landsiedel Technical University of Munich, Munich, Germany
Christian Pacha Infineon Technologies, Munich, Germany
Published in:
· Proceeding
DAC '09 Proceedings of the 46th Annual Design Automation Conference
Pages 947-950
ACM New York, NY, USA ©2009
table of contents ISBN: 978-1-60558-497-3 doi>10.1145/1629911.1630154
Architectural assessment of design techniques to improve speed and robustness in embedded microprocessors Published by ACM 2009 Article
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