Distance metric learning from uncertain side information with application to automated photo tagging

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Authors: Lei Wu University of Science and Technology of China, Hefei, China
Steven C.H. Hoi Nanyang Technological University, Singapore
Rong Jin Michigan State University, Lansing, MI, USA
Jianke Zhu ETH Zurich, Zurich, Switzerland
Nenghai Yu MOE-Microsoft Keynote Lab of MCC, Hefei, China
Distance metric learning from uncertain side information with application to automated photo tagging Published by ACM 2009 Article
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· Proceeding
MM '09 Proceedings of the 17th ACM international conference on Multimedia
Pages 135-144
ACM New York, NY, USA ©2009
table of contents ISBN: 978-1-60558-608-3 doi>10.1145/1631272.1631293

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