Effective defect classification for flat display panel film images

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Authors: Chung-Ho Noh Hankuk University of Foreign Studies
Seok-Lyong Lee Hankuk University of Foreign Studies
Deok-Hwan Kim Inha University
Chin-Wan Chung College of Information & Science Technology, KAIST
Effective defect classification for flat display panel film images Published by ACM 2009 Article
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ICHIT '09 Proceedings of the 2009 International Conference on Hybrid Information Technology
Pages 264-267
ACM New York, NY, USA ©2009
table of contents ISBN: 978-1-60558-662-5 doi>10.1145/1644993.1645044

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