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SCAMPI: a scalable CAM-based algorithm for multiple pattern inspection

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Authors: Fabrizio Petrini IBM T.J. Watson Research, Yorktown Heights, NY
Virat Agarwal IBM T.J. Watson Research, Yorktown Heights, NY
Davide Pasetto IBM Technology Campus, Mulhuddart, Dublin, Ireland
Published in:
· Proceeding
SC '09 Proceedings of the Conference on High Performance Computing Networking, Storage and Analysis
ACM New York, NY, USA ©2009
table of contents ISBN: 978-1-60558-744-8 doi>10.1145/1654059.1654106
SCAMPI: a scalable CAM-based algorithm for multiple pattern inspection Published by ACM 2009 Article
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· Citation Count: 0


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