Characterizing and mitigating the impact of process variations on phase change based memory systems

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Authors: Wangyuan Zhang University of Florida
Tao Li University of Florida
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· Proceeding
MICRO 42 Proceedings of the 42nd Annual IEEE/ACM International Symposium on Microarchitecture
Pages 2-13
ACM New York, NY, USA ©2009
table of contents ISBN: 978-1-60558-798-1 doi>10.1145/1669112.1669116
Characterizing and mitigating the impact of process variations on phase change based memory systems Published by ACM 2009 Article
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· Citation Count: 11


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