MEASURE+: a measurement-based dependability analysis package

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Authors: Dong Tang Univ. of Illinois, Urbana-Champaign
Ravishankar K. Iyer Univ. of Illinois, Urbana-Champaign
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· Proceeding
SIGMETRICS '93 Proceedings of the 1993 ACM SIGMETRICS conference on Measurement and modeling of computer systems
Pages 110-121
ACM New York, NY, USA ©1993
table of contents ISBN:0-89791-580-1 doi>10.1145/166955.166996
· Newsletter
ACM SIGMETRICS Performance Evaluation Review Homepage
Volume 21 Issue 1, June 1993
Pages 110 - 121
ACM New York, NY, USA
table of contents doi>10.1145/166962.166996
MEASURE+: a measurement-based dependability analysis package Published by ACM 1993 Article
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