RFID survivability quantification and attack modeling

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Author: Yanjun Zuo University of North Dakota, Grand Forks, ND, USA
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· Proceeding
WiSec '10 Proceedings of the third ACM conference on Wireless network security
Pages 13-18
ACM New York, NY, USA ©2010
table of contents ISBN: 978-1-60558-923-7 doi>10.1145/1741866.1741870
RFID survivability quantification and attack modeling Published by ACM 2010 Article
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