SIGN IN
SIGN UP
Graph theoretic approach for scan cell reordering to minimize peak shift power
Full Text:
Pdf
Buy this Article
Authors:
Jaynarayan T. Tudu
Indian Institute of Science, Bangalore, India
Erik Larsson
Linkoping University, Linkoping, Sweden
Virendra Singh
Indian Institute of Science, Bangalore, India
Hideo Fujiwara
Nara Institute of Science and Technology, Nara, Japan
2010 Article
Bibliometrics
· Downloads (6 Weeks): 1
· Downloads (12 Months): 13
· Downloads (cumulative): 78
· Citation Count: 0
Published in:
· Proceeding
GLSVLSI '10
Proceedings of the 20th symposium on Great lakes symposium on VLSI
Pages 73-78
ACM
New York, NY
, USA
©2010
table of contents
ISBN: 978-1-4503-0012-4
doi>
10.1145/1785481.1785499
Tools and Resources
Buy this Article
Request Permissions
TOC Service:
Email
RSS
Save to Binder
Export Formats:
BibTeX
EndNote
ACM Ref
Share:
|
Tags:
algorithms
peak power
power droop
scan chain reordering
testability
testability
Feedback
|
Switch to
single page view
(no tabs)
**Javascript is not enabled and is required for the "tabbed view" or switch to the
single page view
**
Powered by
The ACM Guide to Computing Literature
All Tags
Export Formats
Save to Binder