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Design of self correcting radiation hardened digital circuits using decoupled ground bus
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Authors:
Sohan Purohit
University of Massachusetts Lowell, Lowell, MA, USA
Sai Rahul Chalamalasetti
University of Massachusetts Lowell, Lowell, MA, USA
Martin Margala
University of Massachusetts Lowell, Lowell, MA, USA
Published in:
· Proceeding
GLSVLSI '10
Proceedings of the 20th symposium on Great lakes symposium on VLSI
Pages 405-408
ACM
New York, NY
, USA
©2010
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ISBN: 978-1-4503-0012-4
doi>
10.1145/1785481.1785575
2010 Article
Poster
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Tags:
design
performance
radiation hardening
reliability
reliability and testing
self-repairing circuits
soft errors
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