A serially addressable, flexible current monitor for test fixture based IDDQ/ISSQtesting

Author: Alan Hales Texas Instruments Incorporated, Dallas, TX
Published in:
· Proceeding
ITC'94 Proceedings of the 1994 international conference on Test
Pages 223-232
IEEE Computer Society Washington, DC, USA ©1994
table of contents ISBN:0-7803-2102-2
A serially addressable, flexible current monitor for test fixture based I<inf>DDQ</inf>/I<inf>SSQ</inf>testing 1994 Article
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· Citation Count: 2


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