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Learning universal probabilistic models for fault localization

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Authors: Min Feng University of California at Riverside, Riverside, CA, USA
Rajiv Gupta University of California at Riverside, Riverside, CA, USA
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· Proceeding
PASTE '10 Proceedings of the 9th ACM SIGPLAN-SIGSOFT workshop on Program analysis for software tools and engineering
ACM New York, NY, USA ©2010
table of contents ISBN: 978-1-4503-0082-7 doi>10.1145/1806672.1806688
Learning universal probabilistic models for fault localization Published by ACM 2010 Article
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· Citation Count: 1


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