Occluded text restoration and recognition

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Authors: Lanlan Chang Fujitsu R & D Center, Beijing, P.R. China
Jun Sun Fujitsu R & D Center, Beijing, P.R. China
Misako Suwa Fujitsu Laboratories, Kawasaki, Japan
Hiroaki Takebe Fujitsu Laboratories, Kawasaki, Japan
Yuan He Fujitsu R & D Center, Beijing, P.R. China
Satoshi Naoi Fujitsu R & D Center, Beijing, P.R. China
Occluded text restoration and recognition Published by ACM 2010 Article
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· Proceeding
DAS '10 Proceedings of the 9th IAPR International Workshop on Document Analysis Systems
Pages 151-158
ACM New York, NY, USA ©2010
table of contents ISBN: 978-1-60558-773-8 doi>10.1145/1815330.1815350

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