Directed test generation for effective fault localization

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Authors: Shay Artzi IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA
Julian Dolby IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA
Frank Tip IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA
Marco Pistoia IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA
Directed test generation for effective fault localization Published by ACM 2010 Article
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· Proceeding
ISSTA '10 Proceedings of the 19th international symposium on Software testing and analysis
Pages 49-60
ACM New York, NY, USA ©2010
table of contents ISBN: 978-1-60558-823-0 doi>10.1145/1831708.1831715

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