Metric forensics: a multi-level approach for mining volatile graphs

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Authors: Keith Henderson Lawrence Livermore National Laboratory, Livermore, CA, USA
Tina Eliassi-Rad Lawrence Livermore National Laboratory, Livermore, CA, USA
Christos Faloutsos Carnegie Mellon University, Pittsburgh, PA, USA
Leman Akoglu Carnegie Mellon University, Pittsburgh, PA, USA
Lei Li Carnegie Mellon University, Pittsburgh, PA, USA
Koji Maruhashi Fujitsu Laboratories Ltd., Kawasaki, Japan
B. Aditya Prakash Carnegie Mellon University, Pittsburgh, PA, USA
Hanghang Tong Carnegie Mellon University, Pittsburgh, PA, USA
Metric forensics: a multi-level approach for mining volatile graphs Published by ACM 2010 Article
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· Proceeding
KDD '10 Proceedings of the 16th ACM SIGKDD international conference on Knowledge discovery and data mining
Pages 163-172
ACM New York, NY, USA ©2010
table of contents ISBN: 978-1-4503-0055-1 doi>10.1145/1835804.1835828

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