Carbon nanotube correlation: promising opportunity for CNFET circuit yield enhancement

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Authors: Jie Zhang Stanford University, Stanford, CA
Shashikanth Bobba LSI-EPFL, Lausanne, Switzerland
Nishant Patil Stanford University, Stanford, CA
Albert Lin Stanford University, Stanford, CA
H.-S. Philip Wong Stanford University, Stanford, CA
Giovanni De Micheli LSI-EPFL, Lausanne, Switzerland
Subhasish Mitra Stanford University, Stanford, CA
Carbon nanotube correlation: promising opportunity for CNFET circuit yield enhancement Published by ACM 2010 Article
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· Proceeding
DAC '10 Proceedings of the 47th Design Automation Conference
Pages 889-892
ACM New York, NY, USA ©2010
table of contents ISBN: 978-1-4503-0002-5 doi>10.1145/1837274.1837497

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