Post-silicon power characterization using thermal infrared emissions

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Authors: Ryan Cochran Brown University, Providence, RI, USA
Abdullah Nama Nowroz Brown University, Providence, RI, USA
Sherief Reda Brown University, Providence, RI, USA
Published in:
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· Proceeding
ISLPED '10 Proceedings of the 16th ACM/IEEE international symposium on Low power electronics and design
Pages 331-336
ACM New York, NY, USA ©2010
table of contents ISBN: 978-1-4503-0146-6 doi>10.1145/1840845.1840914
Post-silicon power characterization using thermal infrared emissions Published by ACM 2010 Article
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