Random unit-test generation with MUT-aware sequence recommendation

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Authors: Wujie Zheng The Chinese University of Hong Kong, Hong Kong, China
Qirun Zhang The Chinese University of Hong Kong, Hong Kong, China
Michael Lyu The Chinese University of Hong Kong, Hong Kong, China
Tao Xie North Carolina State University, North Carolina, USA
Random unit-test generation with MUT-aware sequence recommendation Published by ACM 2010 Article
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ASE '10 Proceedings of the IEEE/ACM international conference on Automated software engineering
Pages 293-296
ACM New York, NY, USA ©2010
table of contents ISBN: 978-1-4503-0116-9 doi>10.1145/1858996.1859054

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