Mutation analysis vs. code coverage in automated assessment of students' testing skills

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Authors: Kalle Aaltonen Finland
Petri Ihantola Aalto University, Helsinki, Finland
Otto Seppälä Aalto University, Helsinki, Finland
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· Proceeding
SPLASH '10 Proceedings of the ACM international conference companion on Object oriented programming systems languages and applications companion
Pages 153-160
ACM New York, NY, USA ©2010
table of contents ISBN: 978-1-4503-0240-1 doi>10.1145/1869542.1869567
Mutation analysis vs. code coverage in automated assessment of students' testing skills Published by ACM 2010 Article
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