Spatial outlier detection: random walk based approaches

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Authors: Xutong Liu Virginia Tech
Chang-Tien Lu Virginia Tech
Feng Chen Virginia Tech
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· Proceeding
GIS '10 Proceedings of the 18th SIGSPATIAL International Conference on Advances in Geographic Information Systems
Pages 370-379
ACM New York, NY, USA ©2010
table of contents ISBN: 978-1-4503-0428-3 doi>10.1145/1869790.1869841
Spatial outlier detection: random walk based approaches Published by ACM 2010 Article
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