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Cycles, cells and platters: an empirical analysisof hardware failures on a million consumer PCs
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Authors:
Edmund B. Nightingale
Microsoft Research, Redmond, WA, USA
John R. Douceur
Microsoft Research, Redmond, WA, USA
Vince Orgovan
Microsoft Corporation, Redmond, WA, USA
Published in:
· Proceeding
EuroSys '11
Proceedings of the sixth conference on Computer systems
Pages 343-356
ACM
New York, NY
, USA
©2011
table of contents
ISBN: 978-1-4503-0634-8
doi>
10.1145/1966445.1966477
2011 Article
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· Citation Count: 5
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fault tolerance
measurement
reliability
reliability
reliability
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