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Layout-aware variation evaluation of analog circuits and its validity on op-amp designs
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Authors:
Kota Shinohara
The University of Kitakyushu, Kitakyushu, Japan
Mihoko Hidaka
The University of Kitakyushu, Kitakyushu, Japan
Jing Li
The University of Kitakyushu, Kitakyushu, Japan
Qing Dong
The University of Kitakyushu, Kitakyushu, Japan
Bo Yang
The University of Kitakyushu, Kitakyushu, Japan
Shigetoshi Nakatake
The University of Kitakyushu, Kitakyushu, Japan
2011 Article
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Published in:
· Proceeding
GLSVLSI '11
Proceedings of the 21st edition of the great lakes symposium on Great lakes symposium on VLSI
Pages 247-252
ACM
New York, NY
, USA
©2011
table of contents
ISBN: 978-1-4503-0667-6
doi>
10.1145/1973009.1973059
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Tags:
analog layout
layout-dependent variation
monte carlo analysis
op-amp design
performance analysis and design aids
reliability
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