Diagnosing new faults using mutants and prior faults (NIER track)

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Authors:	Syed Shariyar Murtaza	University of Western Ontario, London, ON, Canada
	Nazim Madhavji	University of Western Ontario, London, ON, Canada
	Mechelle Gittens	University of Western Ontario, London, ON, Canada & University of West Indies, Cave Hill, Barbados
	Zude Li	University of Western Ontario, London, ON, Canada

	2011 Article
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	· Proceeding
	ICSE '11 Proceedings of the 33rd International Conference on Software Engineering
	Pages 960-963 ACM New York, NY, USA ©2011 table of contents ISBN: 978-1-4503-0445-0 doi>10.1145/1985793.1985959

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