Component-based track inspection using machine-vision technology

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Authors: Ying Li Exploratory Computer Vision Group, IBM T. J. Watson Research Center, NY
Charles Otto Exploratory Computer Vision Group, IBM T. J. Watson Research Center, NY
Norm Haas Exploratory Computer Vision Group, IBM T. J. Watson Research Center, NY
Yuichi Fujiki Exploratory Computer Vision Group, IBM T. J. Watson Research Center, NY
Sharath Pankanti Exploratory Computer Vision Group, IBM T. J. Watson Research Center, NY
Component-based track inspection using machine-vision technology Published by ACM 2011 Article
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· Proceeding
ICMR '11 Proceedings of the 1st ACM International Conference on Multimedia Retrieval
Article No. 60
ACM New York, NY, USA ©2011
table of contents ISBN: 978-1-4503-0336-1 doi>10.1145/1991996.1992056

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