Six degrees of scientific data: reading patterns for extreme scale science IO

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Authors: Jay Lofstead Sandia National Laboratories, Albuquerque, NM, USA
Milo Polte Carnegie Mellon University, Pittsburgh, PA, USA
Garth Gibson Carnegie Mellon University, Pittsburgh, PA, USA
Scott Klasky Oak Ridge National Laboratory, Oak Ridge, TN, USA
Karsten Schwan Georgia Institute of Technology, Atlanta, GA, USA
Ron Oldfield Sandia National Laboratories, Albuquerque, NM, USA
Matthew Wolf Georgia Institute of Technology, Atlanta, GA, USA
Qing Liu Oak Ridge National Laboratory, Oak Ridge, TN, USA
Six degrees of scientific data: reading patterns for extreme scale science IO Published by ACM 2011 Article
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· Proceeding
HPDC '11 Proceedings of the 20th international symposium on High performance distributed computing
Pages 49-60
ACM New York, NY, USA ©2011
table of contents ISBN: 978-1-4503-0552-5 doi>10.1145/1996130.1996139

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