CUTE: constrained and unconstrained testing environment

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Authors: I. Bongartz IBM T. J. Watson Research Center, Yorktown Heights, NY
A. R. Conn IBM T. J. Watson Research Center, Yorktown Heights, NY
Nick Gould Rutherford Appleton Lab, Oxfordshire, UK
Ph. L. Toint Univ. Notre Dame de la Paix, Namur, Belgium
CUTE: constrained and unconstrained testing environment Published by ACM 1995 Article
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ACM Transactions on Mathematical Software (TOMS) TOMS Homepage archive
Volume 21 Issue 1, March 1995
Pages 123-160
ACM New York, NY, USA
table of contents doi>10.1145/200979.201043

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