Strong higher order mutation-based test data generation

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Authors: Mark Harman University College London, London, United Kingdom
Yue Jia University College London, London, United Kingdom
William B. Langdon University College London, London, United Kingdom
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· Proceeding
ESEC/FSE '11 Proceedings of the 19th ACM SIGSOFT symposium and the 13th European conference on Foundations of software engineering
Pages 212-222
ACM New York, NY, USA ©2011
table of contents ISBN: 978-1-4503-0443-6 doi>10.1145/2025113.2025144
Strong higher order mutation-based test data generation Published by ACM 2011 Article
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