Micro interaction metrics for defect prediction

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Authors:	Taek Lee	Korea University, Seoul, South Korea
	Jaechang Nam	The Hong Kong University of Science and Technology, Hong Kong, Hong Kong
	DongGyun Han	The Hong Kong University of Science and Technology, Hong Kong, Hong Kong
	Sunghun Kim	The Hong Kong University of Science and Technology, Hong Kong, Hong Kong
	Hoh Peter In	Korea University, Seoul, South Korea

	2011 Article
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	· Proceeding
	ESEC/FSE '11 Proceedings of the 19th ACM SIGSOFT symposium and the 13th European conference on Foundations of software engineering
	Pages 311-321 ACM New York, NY, USA ©2011 table of contents ISBN: 978-1-4503-0443-6 doi>10.1145/2025113.2025156

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