SCORE: a scalable concolic testing tool for reliable embedded software

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Authors: Yunho Kim Korea Advanced Institute of Science and Technology, Daejeon, South Korea
Moonzoo Kim Korea Advanced Institute of Science and Technology, Daejeon, South Korea
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· Proceeding
ESEC/FSE '11 Proceedings of the 19th ACM SIGSOFT symposium and the 13th European conference on Foundations of software engineering
Pages 420-423
ACM New York, NY, USA ©2011
table of contents ISBN: 978-1-4503-0443-6 doi>10.1145/2025113.2025180
SCORE: a scalable concolic testing tool for reliable embedded software Published by ACM 2011 Article
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