Using random walks for multi-label classification

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Authors: Chaokun Wang Tsinghua University, Beijing, China
Wei Zheng Tsinghua University, Beijing, China
Zhang Liu Tsinghua University, Beijing, China
Yiyuan Bai Tsinghua University, Beijing, China
Jianmin Wang Tsinghua University, Beijing, China
Using random walks for multi-label classification Published by ACM 2011 Article
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CIKM '11 Proceedings of the 20th ACM international conference on Information and knowledge management
Pages 2197-2200
ACM New York, NY, USA ©2011
table of contents ISBN: 978-1-4503-0717-8 doi>10.1145/2063576.2063925

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