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PowerField: a transient temperature-to-power technique based on Markov random field theory
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Authors:
Seungwook Paek
KAIST, Daejeon, Korea
Seok-Hwan Moon
ETRI, Daejeon, Korea
Wongyu Shin
KAIST, Daejeon, Korea
Jaehyeong Sim
KAIST, Daejeon, Korea
Lee-Sup Kim
KAIST, Daejeon, Korea
2012 Article
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Published in:
· Proceeding
DAC '12
Proceedings of the 49th Annual Design Automation Conference
Pages 630-635
ACM
New York, NY
, USA
©2012
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ISBN: 978-1-4503-1199-1
doi>
10.1145/2228360.2228474
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Tags:
algorithms
experimentation
markov random field
measurement
measurement techniques
post-silicon verification
power
thermal imaging
verification
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