Quality considerations in delay fault testing

Full Text: PdfPdf Buy this ArticleBuy this Article
Authors: Alicja Pierzynska School of Computing Science, Simon Fraser University, Burnaby, BC, Canada V5A 1S6
Slawomir Pilarski School of Computing Science, Simon Fraser University, Burnaby, BC, Canada V5A 1S6
Published in:
· Proceeding
EURO-DAC '95/EURO-VHDL '95 Proceedings of the conference on European design automation
Pages 196 - 201
IEEE Computer Society Press Los Alamitos, CA, USA ©1995
table of contents ISBN:0-8186-7156-4
Quality considerations in delay fault testing 1995 Article
Bibliometrics Data  Bibliometrics
· Downloads (6 Weeks): 1
· Downloads (12 Months): 5
· Downloads (cumulative): 74
· Citation Count: 3


Tools and Resources

Share:

|
feedback Feedback | Switch to single page view (no tabs)

Powered by The ACM Guide to Computing Literature


The ACM Digital Library is published by the Association for Computing Machinery. Copyright © 2013 ACM, Inc.
Terms of Usage   Privacy Policy   Code of Ethics   Contact Us

Useful downloads: Adobe Acrobat    QuickTime    Windows Media Player    Real Player
The ACM Guide to Computing Literature
All Tags
Export Formats
 
 
Save to Binder