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Efficient orthonormality testing for synthesis with pass-transistor selectors
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Authors:
Michel Berkelaar
Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven, The Netherlands
Lukas P. P. P. van Ginneken
Synopsys Inc., 700 East Middlefield Road, Mountain View, CA
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· Proceeding
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
IEEE Computer Society
Washington, DC
, USA
©1995
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ISBN:0-8186-7213-7
1995 Article
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· Downloads (6 Weeks): 2
· Downloads (12 Months): 4
· Citation Count: 3
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measurement
performance
reliability and testing
reliability and testing
theory
verification
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