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A sparse image method for BEM capacitance extraction
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Authors:
Byron Krauter
IBM Corp., 11400 Burnet Road, Austin, TX
Yu Xia
AMD Corp., 5900 E. Ben White Blvd, Austin, TX
Aykut Dengi
SEMATECH Inc., 2706 Montopolis Drive, Austin, TX
Lawrence T. Pileggi
Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA
1996 Article
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Published in:
· Proceeding
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Pages 357-362
ACM
New York, NY
, USA
©1996
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ISBN:0-89791-779-0
doi>
10.1145/240518.240586
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