Substrate noise influence on circuit performance in variable threshold-voltage scheme

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Authors: Tadahiro Kuroda System ULSI Engineering Laboratory, Toshiba Corp., Kawasaki, Japan
Tetsuya Fujita System ULSI Engineering Laboratory, Toshiba Corp., Kawasaki, Japan
Shinji Mita System ULSI Engineering Laboratory, Toshiba Corp., Kawasaki, Japan
Toshiaki Mori Semiconductor Group, Toshiba Corp., Kawasaki, Japan
Kenji Matsuo Semiconductor Group, Toshiba Corp., Kawasaki, Japan
Masakazu Kakumu Semiconductor Group, Toshiba Corp., Kawasaki, Japan
Takayasu Sakurai System ULSI Engineering Laboratory, Toshiba Corp., Kawasaki, Japan
Substrate noise influence on circuit performance in variable threshold-voltage scheme 1996 Article
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· Proceeding
ISLPED '96 Proceedings of the 1996 international symposium on Low power electronics and design
Pages 309-312
IEEE Press Piscataway, NJ, USA ©1996
table of contents ISBN:0-7803-3571-6

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