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A study on the failure intensity of different software faults
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Authors:
Kazuyuki Shima
Graduate School of Information Science, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma, Nara, Japan
Shingo Takada
Graduate School of Information Science, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma, Nara, Japan
Ken'ichi Matsumoto
Graduate School of Information Science, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma, Nara, Japan
Koji Torii
Graduate School of Information Science, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma, Nara, Japan
1997 Article
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· Proceeding
ICSE '97 Proceedings of the 19th international conference on Software engineering
Pages 86-94
ACM
New York, NY
, USA
©1997
table of contents
ISBN:0-89791-914-9
doi>
10.1145/253228.253247
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Tags:
design
experimentation
failure intensity
gamma distribution
hyperexponential srgm
littlewood model
measurement
performance
reliability
reliability
software reliability growth model
testing
testing and debugging
theory
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