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Boolean matching for full-custom ECL gates

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Authors: Robert N. Mayo Western Research Laboratory, Digital Equipment Corporation, Palo Alto, CA
Hervé Touati Paris Research Laboratory, Digital Equipment Corporation, Rueil-Malmaison, France
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· Proceeding
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
IEEE Computer Society Press Los Alamitos, CA, USA ©1993
table of contents ISBN:0-8186-4490-7
Boolean matching for full-custom ECL gates 1993 Article
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· Citation Count: 1


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